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IEEE Spectrum

Advanced low-frequency noise measurement system: 9812DX

The 9812DX system, consisting of three current amplifiers and one voltage amplifier, fully demonstrates its superior capabilities and versatility measuring low-frequency noise characteristics of onwafer transistors over a wide range of bias voltage 200V, bias current 200mA and operating frequency bandwidth 0.03Hz – 10 MHz down to an extremely low noise resolution of 1e-27 A2/Hz.

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